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Onderzoeker
Michele Pavan
- Disciplines:Mechatronica en robotica, Mariene ingenieurskunde
Affiliaties
- Maakprocessen en -Systemen (MaPS) (Afdeling)
Lid
Vanaf1 aug 2020 → 30 jun 2018 - Werktuigkundige Industriële Ingenieurstechnieken, Campus Groep T Leuven (Technologiecluster)
Lid
Vanaf1 sep 2014 → 30 jun 2018
Publicaties
1 - 10 van 12
- Optimization of the Additive Manufacturing Process for Geometrically Complex Vibro-acoustic Metamaterials(2019)
Auteurs: Michele Pavan, Matias Clasing Villanueva, Tom Craeghs, Claus Claeys, Elke Deckers, Wim Desmet
Pagina's: 1976 - 1989Aantal pagina's: 14 - CT-based optimization of Laser Sintering of Polyamide-12(2018)
Auteurs: Michele Pavan, Wim Dewulf, Jean-Pierre Kruth
- Investigating the influence of X-ray CT parameters on porosity measurement of laser sintered PA12 parts using a design-of-experiment approach(2018)
Auteurs: Michele Pavan, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 203 - 212 - On the influence of inter-layer time and energy density on selected critical-to-quality properties of PA12 parts produced via laser sintering(2017)
Auteurs: Michele Pavan, Matthias Faes, Dieter Strobbe, Brecht Van Hooreweder, David Moens, Wim Dewulf
Pagina's: 386 - 395 - Applications of CT for dimensional metrology(2017)
Auteurs: Michele Pavan
Pagina's: 333 - 369 - CT-based quality control of Laser Sintering of Polymers(2016)
Auteurs: Michele Pavan, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 62 - 68 - Using X-ray computed tomography to improve the porosity level of polyamide-12 laser sintered parts(2016)
Auteurs: Wim Dewulf, Michele Pavan, Tom Craeghs, Jean-Pierre Kruth
Pagina's: 205 - 208 - Understanding the link between process parameters, microstructure and mechanical properties of laser sintered PA12 parts through X-Ray Computed Tomography(2016)
Auteurs: Michele Pavan, Peter Van Puyvelde, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 569 - 574 - Understanding the laser sintering of polymers at microscale level by using X-ray computed tomography(2016)
Auteurs: Michele Pavan, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 1112 - 1125 - Influence of Electron Beam Alignment on Dimensional Metrology by Computed Tomography(2015)
Auteurs: Gabriel Probst, Michele Pavan, Jean-Pierre Kruth, Wim Dewulf