- Highly Reliable Physically Unclonable Functions: Design, Characterization and Security Analysis(2020)
Auteurs: Kent Chuang, Ingrid Verbauwhede, Guido Groeseneken
- A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8fJ/bit in 40nm CMOS(2019)
Auteurs: Ingrid Verbauwhede, Kent Chuang
Pagina's: 2765 - 2776
- Array-based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {VG,VD} bias space(2019)
Auteurs: Kent Chuang, Michiel Vandemaele
Aantal pagina's: 6
- Self-heating-aware CMOS reliability characterization using degradation maps(2018)
Auteurs: Kent Chuang, Marko Simicic
Pagina's: 2A.31 - 2A.36
- A Multi-bit/cell PUF Using Analog Breakdown Positions in CMOS(2018)
Auteurs: Kent Chuang, Guido Groeseneken, Ingrid Verbauwhede
Aantal pagina's: 5
- X-ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices(2018)
Auteurs: Kent Chuang, Ingrid Verbauwhede
Pagina's: 1519 - 1524
- A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS(2018)
Auteurs: Kent Chuang, Ingrid Verbauwhede
Pagina's: 157 - 160
Aantal pagina's: 4
- (Invited) Recent insights in CMOS reliability characterization by the use of degradation maps(2018)
Auteurs: Kent Chuang
Pagina's: 226 - 229
Aantal pagina's: 4
- A cautionary note when looking for a truly reconfigurable resistive RAM PUF(2018)
Auteurs: Kent Chuang, Guido Groeseneken, Ingrid Verbauwhede
Pagina's: 98 - 117
- Statistical assessment of the full VG/VD degradation space using dedicated device arrays(2017)
Auteurs: Kent Chuang, Marko Simicic, Guido Groeseneken
Pagina's: 2