Interferometer for superresolved Raman microscopy

A Raman microscope system for characterizing a sample of interest, the Raman microscope system comprising an excitation unit for inducing Raman scattering at a sample plane and a Raman scattering detection unit for detecting Raman scattering from the sample. The excitation unit comprises a beam splitter for splitting a radiation pump beam into two coherent pump beams, optical elements for guiding the two pump beams along two optical paths towards the sample plane so as to form two counter-propagating pump beams at the sample plane forming an interference pattern at the sample plane for inducing Raman scattering and a phase difference detection scheme for detecting a phase difference occurring at the sample plane from none-blocked parts of the two counter-propagating pump beams after their passage at the sample plane.

Octrooi-publicatienummer: EP3421977

Jaar aanvraag: 2017

Jaar toekenning: 2020

Jaar van publicatie: 2019

Status: Aangevraagd

Technologiedomeinen: Meting, Optica

Gevalideerd voor IOF-sleutel: Ja

Toegewezen aan: Associatie Universiteit Gent