Automated Electron diffractometer for high throughput identification of nanocrystalline materials KU Leuven
The study of the structure of nanocrystalline materials is often difficult as standard X-ray diffraction techniques break down for sub micrometer particles, especially when occurring in a mixture. This is resolved by trying to crystallize specific compounds in larger crystals, but this is often problematic and time consuming. State of the art single crystal X-ray diffraction moreover requires a trip to a synchrotron which creates unnecessary ...