Identify and quantify intrinsic defects in TMD monolayers via scanning probe microscopy for ultra-scaled nanoelectronic logic applications KU Leuven
Two-dimensional (2D) semiconductors have the potential to complement silicon as a channel material in advanced CMOS devices. As opposed to silicon, these materials are monolayer-thin and markedly less sensitive to detrimental effects encountered in channels with strongly reduced physical dimensions. At this point in time, however, experimental device results are not yet on par with their theoretical performance, which is amongst others due to ...