Methods and systems for material characterization University of Antwerp
The present invention pertains to methods and systems for material characterization. A method (100) is disclosed for determining information regarding an object comprising particles. The method (100) comprises obtaining (110) a wave function representative of the object detected at a detection surface of a detection system for detecting the wave function, deriving (120) at least two spatial frequencies of the detected wave function and deriving (130) for each of said at least two spatial frequencies at least a phase based on the obtained wave function. Furthermore, a functional relationship ...