Increasing the Accuracy and Speed of EMI Near-Field Scanning KU Leuven
Developing an electronic product that is compliant to the EMC Directive "right-first-time" proves to be a hard challenge due to the increasing speed and decreasing size of electronics. Over the last years, near-field scanning has been proposed as a powerful tool to help designers to make EMC-compliant products more efficiently.
A near-field scanner measures the electromagnetic near fields emitted by an electronic device by moving a ...