A novel line-scan algorithm for unsynchronised dynamic measurements University of Antwerp
In non-destructive inspections today, the size of the sample being examined is often limited to fit within the field of view of the camera being used. When examining larger specimens, multiple image sequences need to be stitched together into one image. Due to uneven illumination, the combined image may have artificial defects. This manuscript provides a solution for performing line-scan measurements from a sample and combining the images to ...