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Researcher
Wilfried Vandervorst
- Disciplines:Applied mathematics in specific fields, Condensed matter physics and nanophysics, Atomic and molecular physics, Geophysics, Physical geography and environmental geoscience, Other earth sciences, Aquatic sciences, challenges and pollution, Geomatic engineering
Affiliations
- Quantum Solid State Physics (QSP) (Division)
Member
From1 Aug 2019 → Today - Nuclear and Radiation Physics (Division)
Member
From1 Oct 2007 → 31 Jul 2019 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 1999 → 30 Sep 2007
Projects
11 - 20 of 34
- Boron doped diamond nanoprobes for subnanometre-resolution tomography of nanoelectronic devicesFrom26 Oct 2016 → 31 Jan 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Joint focused ion beam (FIB) facility for nanofabrication and nanocharacterizationFrom1 May 2016 → 30 Apr 2020Funding: FWO Medium Size Research Infrastructure
- Innovation in ion beam analysis for nanoelectronic materialsFrom15 Jun 2015 → 28 Nov 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
- Nucleation and Growth Mechanisms of 2D Semiconductor/high-k Dielectric HeterostacksFrom1 Oct 2014 → 26 Sep 2018Funding: Own budget, for example: patrimony, inscription fees, gifts
- Non-destructive characterization of crystalline defects in 3D heterostructures.From1 Oct 2014 → 31 Dec 2019Funding: FWO Strategic Basic Research Grant
- Correlating structure and properties of novel functional molecular metal clusters deposited on surfaces and embedded in 3D matricesFrom1 Jan 2014 → 31 Dec 2017Funding: FWO research project (including WEAVE projects)
- Unraveling the structure and magnetism of novel ferromagnetic semiconductors at the atomic level.From1 Jan 2014 → 31 Dec 2017Funding: FWO research project (including WEAVE projects)
- Phase formation and defect generation during metallization and ion implantation of GeSn semiconductors.From1 Dec 2013 → 31 May 2019Funding: International Cooperation and Mobility
- Physico-chemical effects in depth profiling of organic semiconductorsFrom1 Dec 2013 → 5 Mar 2018Funding: Own budget, for example: patrimony, inscription fees, gifts
- Atomic scale observation of atom distributions in 3D devices using atom probe tomographyFrom1 Nov 2013 → 2 Oct 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
Publications
1 - 10 of 482
- Micro Four-Point Probe methodology for the in-line electrical characterization of semiconductors and metals in confined volumes(2023)
Authors: Steven Folkersma, Wilfried Vandervorst, Janusz Bogdanowicz
- Probing the spatial dimensions of nanoscale patterns with Rutherford backscattering spectrometry(2023)
Authors: Niels Claessens, Annelies Delabie, André Vantomme, Wilfried Vandervorst, Johan Meersschaut
Pages: 174 - 181 - Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry(2022)
Authors: Niels Claessens, Annelies Delabie, André Vantomme, Wilfried Vandervorst, Johan Meersschaut
- OrbitrapTM-SIMS analysis of advanced semiconductor inorganic structures(2022)
Authors: Wilfried Vandervorst
- A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography(2022)
Authors: Claudia Fleischmann, Wilfried Vandervorst
Pages: 1102 - 1115 - Ensemble RBS: Probing the compositional profile of 3D microscale structures(2022)
Authors: Niels Claessens, Wilfried Vandervorst, André Vantomme, Johan Meersschaut
- Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy(2021)
Authors: Wilfried Vandervorst
Pages: 34531 - 34551 - Light interactions with periodic nanoline arrays for nanoelectronic applications(2021)
Authors: Andrzej Gawlik, Wilfried Vandervorst
- Point defect formation near the epitaxial Ge(001) growth surface and the impact on phosphorus doping activation(2021)
Authors: Wilfried Vandervorst
- Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties(2021)
Authors: Claudia Fleischmann, Wilfried Vandervorst
Patents
1 - 10 of 10
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Device for measuring surface characteristics of a material (Inventor)
- Characterization of regions with different crystallinity in materials (Inventor)
- Method for determining the shape of a sample tip for atom probe tomography (Inventor)
- A device for measuring surface characteristics of a material (Inventor)
- A method and apparatus for transmission for transmission electron (Inventor)
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Method and apparatus for transmission electron microscopy (Inventor)
- A device and method for two dimensional active carrier profiling of semiconductor components (Inventor)
- A method and apparatus for transmission electron microscopy (Inventor)