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Researcher
Wilfried Vandervorst
- Disciplines:Applied mathematics in specific fields, Condensed matter physics and nanophysics, Atomic and molecular physics, Geophysics, Physical geography and environmental geoscience, Other earth sciences, Aquatic sciences, challenges and pollution, Geomatic engineering
Affiliations
- Quantum Solid State Physics (QSP) (Division)
Member
From1 Aug 2019 → Today - Nuclear and Radiation Physics (Division)
Member
From1 Oct 2007 → 31 Jul 2019 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 1999 → 30 Sep 2007
Projects
1 - 10 of 34
- High lateral and depth resolution ion beam analysis of laterally confined nanostructuresFrom2 Sep 2019 → TodayFunding: FWO Strategic Basic Research Grant
- Self-focusing SIMS with in-situ SPM: a paradigm shift in 3D-metrologyFrom12 Oct 2018 → 13 May 2022Funding: Own budget, for example: patrimony, inscription fees, gifts
- Atom-by-atom analysis of advanced semiconductor devices: unraveling the physics of atom probe tomographyFrom20 Aug 2018 → 22 May 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
- Nano-focused Raman spectroscopy for stress and compositional metrologyFrom31 Jul 2018 → 31 Jul 2022Funding: Own budget, for example: patrimony, inscription fees, gifts
- Laser-assisted atom probe tomography of oxide materials: Field evaporation mechanism study and performance improvementFrom15 May 2018 → 18 Dec 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Atomic scale synthesis and atomic scale characterization of complex oxides with electronic/ionic conductivityFrom1 Jan 2018 → 31 Dec 2021Funding: FWO research project (including WEAVE projects)
- Metrology and physical mechanisms of 2D transition metal dichalcogenides and devices.From6 Nov 2017 → 31 Jan 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Towards improved atom probe tomography analysis of semiconductors : unraveling the dynamic evolution of the semiconductor emitterFrom1 Sep 2017 → 31 Dec 2021Funding: FWO Strategic Basic Research Grant
- Fabrication and characterization of reference nano and micro structures for 3D chemical analysisFrom8 Feb 2017 → 8 Jul 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
- Advanced methodology for the in-line electrical characterization of doped semiconductors in confined volumes.From1 Nov 2016 → 29 Aug 2023Funding: FWO Strategic Basic Research Grant
Publications
41 - 50 of 482
- Rutherford backscattering spectrometry analysis of InGaAs nanostructures(2019)
Authors: Wilfried Vandervorst, Johan Meersschaut
- Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography(2019)
Authors: Wilfried Vandervorst
- High-sensitivity Rutherford backscattering spectrometry employing an analyzing magnet and silicon strip detector(2019)
Authors: Wilfried Vandervorst, Johan Meersschaut
Pages: 59 - 63 - Evolution of phosphorus-vacancy clusters in epitaxial germanium(2019)
Authors: Anurag Vohra, Wilfried Vandervorst
- Photonic properties of periodic arrays of nanoscale Si fins(2019)
Authors: Andrzej Gawlik, Wilfried Vandervorst
- Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures(2019)
Authors: Wilfried Vandervorst
Pages: 71 - 106Number of pages: 36 - Epitaxial Growth of (Si)GeSn Source/Drain Layers for Advanced Ge Gate All Around Devices(2019)
Authors: Wilfried Vandervorst
Number of pages: 2 - Measurement of the apex temperature of a nanoscale semiconducting field emitter illuminated by a femtosecond pulsed laser(2018)
Authors: Claudia Fleischmann, Wilfried Vandervorst
- Laser-Induced Periodic Surface Structures (LIPSS) on Heavily Boron-Doped Diamond for Electrode Applications(2018)
Authors: Thijs Boehme, Wilfried Vandervorst
Pages: 43236 - 43251 - Two-Dimensional Crystal Grain Size Tuning in WS2 Atomic Layer Deposition: An Insight in the Nucleation Mechanism(2018)
Authors: Benjamin Groven, Johan Meersschaut, Ben Schoenaers, Andre Stesmans, Wilfried Vandervorst, Marc Heyns, Iuliana Radu, Annelies Delabie
Pages: 7648 - 7663
Patents
1 - 10 of 10
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Device for measuring surface characteristics of a material (Inventor)
- Characterization of regions with different crystallinity in materials (Inventor)
- Method for determining the shape of a sample tip for atom probe tomography (Inventor)
- A device for measuring surface characteristics of a material (Inventor)
- A method and apparatus for transmission for transmission electron (Inventor)
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Method and apparatus for transmission electron microscopy (Inventor)
- A device and method for two dimensional active carrier profiling of semiconductor components (Inventor)
- A method and apparatus for transmission electron microscopy (Inventor)