< Back to previous page
Researcher
Simon Van Beek
- Disciplines:Nanotechnology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 30 Sep 2018 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From13 Mar 2018 → 30 Sep 2018 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 2013 → 31 Dec 2017
Projects
1 - 1 of 1
- Investigation of reliability aspects of STT-MRAM magnetic memory cells.From3 Sep 2013 → 27 Aug 2018Funding: IWT personal funding - strategic basic research grants, BOF - Doctoral projects
Publications
1 - 10 of 10
- Impact of operating temperature on the electrical and magnetic properties of the bottom-pinned perpendicular magnetic tunnel junctions(2018)
Authors: Yueh Chang Wu, Simon Van Beek, Johanna Jochum, Margriet Van Bael, Jan Van Houdt, Guido Groeseneken
- Reliability Characterization of STT-MRAM Magnetic Memory. The Impact of Self-Heating(2018)
Authors: Simon Van Beek, Guido Groeseneken
- Spin-torque-driven MTJs with extended free layer for logic applications(2018)
Authors: Eline Raymenants, Simon Van Beek, Iuliana Radu, Marc Heyns
- Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown(2018)
Authors: Simon Van Beek
Pages: PMY.51 - PMY.56 - Thermal stability analysis and modelling of advanced perpendicular magnetic tunnel junctions(2018)
Authors: Simon Van Beek, Koen Martens, Yueh Chang Wu, Guido Groeseneken
- Impact of self-heating on reliability predictions in STT-MRAM(2018)
Authors: Simon Van Beek
Number of pages: 4 - Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM(2017)
Authors: Simon Van Beek, Koen Martens, Guido Groeseneken
Pages: 5 - Experimental Observation of Back-Hopping With Reference Layer Flipping by High-Voltage Pulse in Perpendicular Magnetic Tunnel Junctions(2016)
Authors: Simon Van Beek
- Voltage acceleration and pulse dependence of barrier breakdown in MgO based magnetic tunnel junctions(2016)
Authors: Simon Van Beek, Koen Martens, Guido Groeseneken
Number of pages: 4 - Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions(2015)
Authors: Simon Van Beek, Koen Martens, Guido Groeseneken
Number of pages: 6