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Researcher
Seyedeh Sahar Sahhaf
- Disciplines:Other engineering and technology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Modelling, Multimedia processing
Affiliations
- Department of Electrical Engineering (ESAT) (Department)
Member
From1 Sep 2006 → 31 Aug 2010
Publications
1 - 8 of 8
- Modelling of charge trapping/Detrapping induced voltage instability in high-k Gate dielectrics(2012)
Authors: Seyedeh Sahar Sahhaf, Kris De Brabanter, Johan Suykens, Bart De Moor, Guido Groeseneken
Pages: 152 - 157 - Review of reliability issues in high k/metal gate stacks
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 239 - 244 - Evidence of a new degradation mechanism in high-k dielectrics at elevated temperatures
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 493 - 498 - Ion-implantation-based low-cost Hk/MG process for CMOS low-power application
Authors: Seyedeh Sahar Sahhaf, Matthieu Gilbert, Guido Groeseneken, Wilfried Vandervorst
Pages: 185 - 186 - Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 272 - 274 - Profiling different kind of generated defects at elevated temperatures in both SiO2 and high-k dielectrics
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 55 - 60 - Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 1078 - 1081 - A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Authors: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pages: 1424 - 1432