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Researcher
Koen Decock
- Disciplines:Scientific computing, Computer theory, Computer hardware, Other computer engineering, information technology and mathematical engineering, Electronics
Affiliations
- Department of Electronics and information systems (Department)
Member
From1 Oct 2008 → 3 Jun 2012
Projects
1 - 1 of 1
- Optical and electrical modeling of thin film solar cellsFrom1 Oct 2008 → 3 Jun 2012Funding: BOF - Other initiatives, FWO fellowships
Publications
21 - 29 of 29
- Deep level transient spectroscopy (DLTS) study of P3HT:PCBM organic solar cells
Authors: Johan Lauwaert, Koen Decock, Marc Burgelman, E Voroshazi, T Aernouts, D Spoltore, F Piersimoni, Freddy Callens, Henk Vrielinck
Number of pages: 1 - Investigation of defects in P3HT:PCBM organic solar cells aged under constant illumination
Authors: Donao Spoltore, Fortunato Piersimoni, Eszter Voroshazi, Koen Decock, Johan Lauwaert, Tom Aernouts, Henk Vrielinck, Jean Manca, Marc Burgelman
Pages: 67 - 67 - Can a multivalent defect be mimicked by several Shockley-Read-Hall-like defects?
Authors: Koen Decock, Marc Burgelman
- About RC-like contacts in deep level transient spectroscopy and Cu(In,Ga)SeU+2082 solar cells
Authors: Johan Lauwaert, Lieselotte Callens, Koen Decock, Marc Burgelman, A Chirila, F Pianezzi, S Buecheler, AN Tiwari, Henk Vrielinck
Pages: 588 - 594 - Uniform reference structures to assess the benefit of grading in thin film solar cell structures
Authors: Koen Decock, Marc Burgelman
Pages: 3323 - 3326 - Defect distributions in thin film solar cells deduced from admittance measurements under different bias voltages
Authors: Koen Decock, Stephan Buecheler, Fabian Pianezzi, Ayodhya N Tiwari, Marc Burgelman
- Analytical versus numerical analysis of back grading in CIGS solar cells
Authors: Koen Decock, Marc Burgelman
Pages: 1550 - 1554 - An automated method to reduce noise of admittance spectra allowing assessment of a large number of complicated spectra
Authors: Koen Decock, Marc Burgelman
Pages: 2922 - 2925 - Modelling multivalent defects in thin film solar cells
Authors: Koen Decock, Marc Burgelman
Pages: 7481 - 7484