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Researcher
Johan Catrysse
- Disciplines:Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Mechatronics and robotics, Safety engineering
Affiliations
- Waves: Core Research and Engineering (WaveCore) (Division)
Member
From1 Aug 2020 → 31 Jul 2020 - Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 31 Dec 2016 - Electrical Engineering Technology (ESAT), Bruges Campus (Technology cluster)
Member
From1 Dec 2018 → 31 Jul 2020 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Nov 2007 → 31 Dec 2016
Projects
1 - 2 of 2
- Enable in-situ low frequency (LF) testingFrom6 Mar 2023 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Risk-Based EMC for Safer Autonomous Systems: Optimized Shielding MeasuresFrom16 Feb 2021 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
Publications
21 - 30 of 50
- Efficient Reciprocity-Based Algorithm to Predict Worst-Case Induced Disturbances on Multi-Conductor Transmission Lines due to an Incoming Plane Wave(2013)
Authors: Filip Vanhee, Davy Pissoort, Johan Catrysse, Guy Vandenbosch, Georges Gielen
Pages: 208 - 216 - Expanding the Stripline Measuring Set-up for the Characterisation of Conductive Gaskets up to 40 GHz(2012)
Authors: Johan Catrysse, Filip Vanhee, Davy Pissoort, Patrick Reynaert
Pages: 669 - 673 - A Measuring Setup for the Characterization of 'in-circuit' Conductive Gaskets up to 40 GHz(2012)
Authors: Johan Catrysse, Filip Vanhee, Davy Pissoort, Patrick Reynaert
Pages: 1 - 6 - Expanding the Frequency Range of the TEM-t Cell for the Measurement of Shielding Materials up to 12 GHz(2012)
Authors: Johan Catrysse, Filip Vanhee, Davy Pissoort
Pages: 1 - 6 - Expanding the Frequency Range for DPI Testing of ICs above 1 GHz: a proposal(2011)
Authors: Johan Catrysse, Davy Pissoort, Filip Vanhee
Pages: 400 - 404 - Mode-Based Semi-Analytical Model to Characterize the Coupling from Large Machines to Test Wires(2011)
Authors: Davy Pissoort, Filip Vanhee, Bart Boesman, Johan Catrysse
Pages: 488 - 493 - A Model for the DM to CM Conversion for Unbalanced Devices at PCB Level(2011)
Authors: Johan Catrysse, Davy Pissoort, Filip Vanhee
Pages: 746 - 749 - A Vector Impedance Meter Method to characterize Multiconductor Transmission Line Parameters(2010)
Authors: Jos Knockaert, Joan Peuteman, Johan Catrysse, Ronnie Belmans
Pages: 1019 - 1025 - FlexµStrip: a New Measuring Probe for the Characterisation of Large Machines In Situ(2010)
Authors: Johan Catrysse, Filip Vanhee, Davy Pissoort
Pages: 230 - 234 - Towards Realistic Test Levels for Bulk Current Injection up to 6 GHz(2010)
Authors: Filip Vanhee, Davy Pissoort, Johan Catrysse, Georges Gielen, Guy Vandenbosch
Pages: 863 - 866