Researcher
Jay Mody
- Disciplines:Classical physics, Elementary particle and high energy physics, Other physical sciences, Applied mathematics in specific fields, Quantum physics, Nuclear physics, Condensed matter physics and nanophysics, Instructional sciences
Affiliations
- Nuclear and Radiation Physics (Division)
Member
From1 Jul 2009 → 31 Dec 2010 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 2006 → 30 Jun 2009
Publications
1 - 10 of 20
- Dopant/carrier profiling for 3D-structures(2014)
Authors: Wilfried Vandervorst, Andreas Schulze, Ajay Kumar Kambham, Jay Mody, Matthieu Gilbert
Pages: 121 - 129 - Two-dimensional carrier mapping at the nanometer-scale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy(2012)
Authors: Jay Mody, Aftab Nazir, Andreas Schulze, Wilfried Vandervorst
Pages: 69 - 73 - Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations(2012)
Authors: Aftab Nazir, Geert Hellings, Andreas Schulze, Jay Mody, Kristin De Meyer, Wilfried Vandervorst
Pages: 38 - 42 - Scanning Spreading Resistance Microscopy for carrier profiling beyond 32nm node(2012)
Authors: Jay Mody, Gerd Zschaetzsch, Sebastian Koelling, An De Keersgieter, Geert Eneman, Ajay Kumar Kambham, Chris Drijbooms, Andreas Schulze, Thomas Chiarella, Naoto Horiguchi, et al.
Pages: 94 - 99 - Dopant and carrier profiling for 3D-device architectures(2011)
Authors: Jay Mody, Ajay Kumar Kambham, Gerd Zschaetzsch, Thomas Chiarella, Nadine Collaert, Liesbeth Witters, Pierre Eyben, Matthieu Gilbert, Sebastian Koelling, Andreas Schulze, et al.
Pages: 108 - 113 - Non-destructive characterization of activated ion-implanted doping profiles based on photomodulated optical reflectance(2011)
Authors: Janusz Bogdanowicz, Jay Mody, Wilfried Vandervorst
Pages: 220 - 224 - 3D-carrier profiling in FinFETs using scanning spreading resistance microscopy(2011)
Authors: Jay Mody, Ajay Kumar Kambham, Andreas Schulze, Wilfried Vandervorst
Number of pages: 4 - Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations(2011)
Authors: Aftab Nazir, Geert Hellings, Andreas Schulze, Jay Mody, Kristin De Meyer, Wilfried Vandervorst
Pages: 38 - 42 - Experimental studies of dose retention and activation in fin field-effect-transistor-based structures (vol 28, pg C1H5, 2010)(2010)
Authors: Jay Mody, Ray Duffy, Pierre Eyben, Jozefien Goossens, Alain Moussa, Wouter Polspoel, Bart Berghmans, MJH van Dal, BJ Pawlak, M Kaiser, et al.
Pages: 648 - 648 - Dopant and carrier profiling in FinFET-based devices with sub-nanometer resolution(2010)
Authors: Jay Mody, Ajay Kumar Kambham, Matthieu Gilbert, Andreas Schulze, Wilfried Vandervorst
Pages: 195 - 196