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Researcher
Chen Wu
- Disciplines:Ceramic and glass materials, Materials science and engineering, Semiconductor materials, Other materials engineering, Metallurgical engineering
Affiliations
- Department of Materials Engineering (Department)
Member
From24 Jul 2011 → 30 Sep 2016
Publications
1 - 10 of 18
- New breakdown mechanism investigation: barrier metal penetration induced soft breakdown in low-k dielectrics(2016)
Authors: Chen Wu, Ingrid De Wolf
Pages: 3 - Low dielectric constant materials for nanoelectronics(2016)
Authors: Chen Wu
Pages: 163 - 271 - Electrical reliability challenges of advanced low-k dielectrics(2016)
Authors: Chen Wu
Pages: 163 - 272 - Towards understanding intrinsic degradation and breakdown mechanisms in SiOCH low-k dielectrics(2015)
Authors: Chen Wu, Ingrid De Wolf
Pages: 1 - 8 - Correlation between stress-induced leakage current and dielectric degradation in ultra-porous SiOCH low-k materials(2015)
Authors: Chen Wu, Ingrid De Wolf
Pages: 1 - 10 - Intrinisic reliability of local interconnects for N7 and beyond(2015)
Authors: Chen Wu
Number of pages: 5 - Electrical reliability challenges of advanced low-k dielectrics(2015)
Authors: Chen Wu
Pages: N3065 - N3070 - Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologies(2015)
Authors: Chen Wu, Deniz Kocaay
Pages: 295 - 298 - Hydrogen outgassing induced liner/barrier reliability degradation in through silicon via's(2014)
Authors: Chen Wu, Ingrid De Wolf
Pages: 1 - 3 - Impact of Cu TSVs on BEOL metal and dielectric reliability(2014)
Authors: Nabi Nabiollahi, Chen Wu, Ingrid De Wolf
Pages: 3