Researcher
Ajay Kumar Kambham
- Disciplines:Classical physics, Elementary particle and high energy physics, Other physical sciences, Applied mathematics in specific fields, Quantum physics, Nuclear physics, Condensed matter physics and nanophysics, Instructional sciences
Affiliations
- Theoretical Physics (Division)
Member
From1 Aug 2009 → 30 Sep 2010 - Nuclear and Radiation Physics (Division)
Member
From25 Aug 2008 → 31 Dec 2013
Publications
1 - 10 of 17
- Dopant/carrier profiling for 3D-structures(2014)
Authors: Wilfried Vandervorst, Andreas Schulze, Ajay Kumar Kambham, Jay Mody, Matthieu Gilbert
Pages: 121 - 129 - 3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography(2013)
Authors: Ajay Kumar Kambham, Matthieu Gilbert, Wilfried Vandervorst
Pages: 65 - 69 - Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography(2013)
Authors: Ajay Kumar Kambham, Arul Kumar, Antonios Florakis, Wilfried Vandervorst
Pages: 2755705 - 3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography(2013)
Authors: Wilfried Vandervorst, Ajay Kumar Kambham, Arul Kumar, Matthieu Gilbert
Pages: 69 - 69 - Application of atom probe tomography to epitaxial layers(2013)
Authors: Matthieu Gilbert, Ajay Kumar Kambham, Federica Gencarelli, Wilfried Vandervorst
Pages: 79 - 80 - Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography(2013)
Authors: Ajay Kumar Kambham, Wilfried Vandervorst
Pages: 2755705 - 2755705 - Junction strategies for 1x nm technology node with FINFET and high mobility channel(2012)
Authors: Naoto Horiguchi, Gerd Zschaetzsch, Yuichiro Sasaki, Ajay Kumar Kambham, Bastien Douhard, Mitsuhiro Togo, Geert Hellings, Jerome Mitard, Liesbeth Witters, Geert Eneman, et al.
Pages: 216 - 221 - Atomic insight of Ge(1-x)Sn(x) using atom probe tomography(2012)
Authors: Federica Gencarelli, Ajay Kumar Kambham, Matthieu Gilbert, Wilfried Vandervorst
Pages: 171 - 178 - Atom-probe-tomographic studies on silicon-based semiconductor devices(2012)
Authors: Ajay Kumar Kambham
Pages: 38 - 44 - Atom probe tomography for 3D-dopant analysis in FinFET devices(2012)
Authors: Ajay Kumar Kambham, Matthieu Gilbert, Wilfried Vandervorst
Pages: 77 - 78