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Publication

A Robust BBPLL-Based 0.18-mu m CMOS Resistive Sensor Interface With High Drift Resilience Over a-40 degrees C-175 degrees C Temperature Range

Journal Contribution - Journal Article

Journal: IEEE Journal of Solid-State Circuits
ISSN: 0018-9200
Issue: 7
Volume: 54
Pages: 1862 - 1873
Number of pages: 12
Publication year:2019
Keywords:Electrical & electronic engineering