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Publication

High-throughput screening of extrinsic point defect properties in Si and Ge : database and applications

Journal Contribution - Journal Article

Journal: CHEMISTRY OF MATERIALS
ISSN: 1520-5002
Issue: 3
Volume: 29
Pages: 975 - 984
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:10
CSS-citation score:1
Authors:National
Authors from:Higher Education
Accessibility:Closed