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An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes
Journal Contribution - Journal Article
© 2013 IEEE. Analog and mixed-signal circuitry forms a substantial part of automotive electronics, and their test application time contributes predominantly to the overall test time. The authors present a low-cost design-for-test technique that allows a high-level of parallelism.-Hans-Joachim Wunderlich, Universität Stuttgart.
Journal: IEEE DESIGN & TEST
Pages: 15 - 23
Number of pages: 9