An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes

© 2013 IEEE. Analog and mixed-signal circuitry forms a substantial part of automotive electronics, and their test application time contributes predominantly to the overall test time. The authors present a low-cost design-for-test technique that allows a high-level of parallelism.-Hans-Joachim Wunderlich, Universität Stuttgart.

Publication year:2018

BOF-keylabel:yes

IOF-keylabel:yes

BOF-publication weight:1

CSS-citation score:1

Authors from:Private, Higher Education