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Publication
Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors
Journal Contribution - Journal Article
Journal: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
ISSN: 1063-8210
Issue: 10
Volume: 28
Pages: 2122 - 2133
Publication year:2020
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors:International
Authors from:Government, Higher Education
Accessibility:Open