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Project

TEM analyses (Prof. Thomas Pardoen).

The main objective of the TEM characterizations is to elucidate the fundamental micro/nanoscopic mechanisms controlling the deformation and fracture of hybrid nanolaminated thin films provided by UCLouvain. Ex-situ advanced TEM techniques such as aberration corrected TEM, automatic crystallographic orientation and nanostrain mapping in TEM as well as analytical TEM will be used to characterize defects and interfaces while quantified in-situ nanomechanical TEM testing will be performed in order to directly observe the plasticity mechanisms inside the microscope. TEM thin foils for the ex-situ and in-situ TEM characterizations will be prepared in EMAT.
Date:27 Jun 2019 →  27 Jun 2020
Keywords:TEM
Disciplines:Nanophysics and nanosystems, Structural and mechanical properties, Surfaces, interfaces, 2D materials, Functionalisation of materials