Local electron spectroscopy at interfaces of low-dimensional and heterogeneous solids

The proposed research aims at the development of a technique to characterize local electron states, workfunction and surface potential at heterogeneous interfaces of low-dimensional solids by using internal photoemission spectroscopy. Thanks to the application of a nanometer-thin insulator between two electrodes, we hope to resolve the effective workfunction differences between the areas (patches) at nm-size. Using this method one can address a number of problems of fundamental character, e.g., the Smoluchowsky wavefunction smoothening over the atomic steps, as well as issues relevant to the electron device operation, such as electrostatic potential distribution at the domain boundaries of 2D-materials, effect of residuals of the layer transfer on local electric fields, threshold voltage variability in MIS transistors, electric field distribution at the surface of oxide-passivated solar cell absorber layers, and degradation of ion bat tery electrodes.

Keywords:electron specttoscopy, thin films, Interface, internal photoemission, band offset, workfunction, electron barrier, electron injection

Disciplines:Condensed matter physics and nanophysics