Electronic and structural properties of complex oxide multilayer systems at the atomic scale: a (S)TEM and EELS investigation.

During this project novel oxide materials (layered systems) will be characterized to provide insight in their macroscopic properties. The techniques used, (scanning) transmission electron microscopy (S/TEM) and electron energy loss spectroscopy (EELS), will provide chemical and structural information down to the atomic scale due to the improved resolution of the QU-Ant-EM microscope. Several data analysis techniques will be compared and adapted in order to maximize the output of information obtained in these experiments.

Keywords:MULTILAYERS, MACROSCOPIC LIMIT

Disciplines:Condensed matter physics and nanophysics

Project type:Collaboration project