Infrastructure
Atomic Force Microscope (AFM)
Atomic force microscopy (AFM) – is technology, which is typically used for measuring both nanoscale topography and their mechanical properties. An attractive and unique operating modality of AFM is the so-called BioAFM, in which the head of atomic force microscope is positioned on top of an optical/fluorescence microscope. Recent developments in the area of atomic force microscopy enable implementation of various modalities, which permit investigation and measurement of specific characteristics. This infrastructure consists of extension to the already existed BioAFM and includes extension of the fluorescence microscope capable of being integrated with AFM; hybrid stage permitting, on the one hand, a larger scan necessary for nanoscale sensitive mechanical property investigation of small as well as larger objects, while on the other hand, the stage allows for precise positioning of the AFM head at the chosen location on the top of samples; FluidFM functionality which in essence represents a nano-syringe capable of manipulating or injecting samples; electrochemical module which permits investigation of nanochemistry at the nanoscale.
This nanobiotechnology based platform allows for achieving investigation of individual molecules and nanoscale objects, provide versatile material characterization as well as perform investigation of mechanical properties of very different types of samples including, cells, plants, nanoparticles, hydrogels, composite, and inorganic materials.