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Project
Near-field measurement techniques for the efficient solving EMC emission Problem (NEATH)
This project aims to develop, implement, test and demonstrate an industrially useful workflow based on various near-field measurement techniques to find the root cause of EMC emissions problem efficiently and cost-effectively solve. It will also examine and indicate how near-field techniques can be used to test prototypes early in the design process or (sub) modules and characterize to avoid later problems of EMC, signal and power integrity.
Date:1 Oct 2012 → 30 Sep 2015
Keywords:EMC emission
Disciplines:Electronics