A novel XEOL microscope for synchrotron applications

In this application we will construct a XEOL microscope which can be coupled to an electrochemical or environmental cell or deployed independently in a synchrotron beam line. The tool will be capable of real time, in-situ, chemically specific imaging of surfaces exposed to a wide range of environments. The lateral resolution will be of the order of 1 tot 50 μm.