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Publication

Investigation of Imprint in FE-HfO2 and Its Recovery

Journal Contribution - Journal Article

Journal: IEEE Transactions on Electron Devices
ISSN: 0018-9383
Issue: 11
Volume: 67
Pages: 4911 - 4917
Publication year:2020
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:2
Authors:International
Authors from:Government, Higher Education
Accessibility:Open

Authors/publisher

  • Y Higashi (First author)
  • B Kaczer (Author)
  • Anne Verhulst (Author)
  • BJ O'Sullivan (Author)
  • N Ronchi (Author)
  • SRC McMitchell (Author)
  • K Banerjee (Author)
  • L Di Piazza (Author)
  • M Suzuki (Author)
  • D Linten (Author)
  • Jan Van Houdt (Last author)

Research units