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Publication
Compact Modeling of Multi-Domain Ferroelectric FETs: Charge Trapping, Channel Percolation and Nucleation-Growth Domain Dynamics
Journal Contribution - e-publication
Journal: IEEE Transactions on Electron Devices
ISSN: 0018-9383
Issue: 4
Volume: 68
Pages: 2107 - 2115
Publication year:2021
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:2
Authors from:Government, Higher Education
Accessibility:Open