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Publication
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
Journal Contribution - Journal Article
Journal: IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN: 0018-9499
Issue: 5
Volume: 68
Pages: 913 - 920
Publication year:2021
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors:International
Authors from:Higher Education
Accessibility:Closed