Publication

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

Journal: ACM Transactions on Design Automation of Electronic Systems

ISSN: 1084-4309

Issue: 5

Volume: 25

Publication year:2020

BOF-keylabel:yes

IOF-keylabel:yes

BOF-publication weight:0.1

CSS-citation score:1

Authors:International

Authors from:Private, Higher Education

Accessibility:Open