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Publication

Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-k Gate Stacks

Journal Contribution - Journal Article

Journal: Ecs Journal Of Solid State Science And Technology
ISSN: 2162-8769
Issue: 2
Volume: 8
Pages: N25 - N31
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors from:Government, Higher Education
Accessibility:Open