In-situ TEM tensile deformation of nanocrystalline Nickel combined with ACOM-TEM technique

Nanostructure materials are found in many different forms of advanced materials. The properties of these materials strongly depend on their nanostructural features and dedicated characterization tools providing nanostatistical data are indispensable for further development of these novel materials. The present project relies on the use of advanced in-situ transmission electron microscopy (TEM) techniques coupled with the automated crystallographic orientation mapping in TEM (ACOM-TEM) approach for the investigation of the elementary deformation mechanisms and mechanical properties in the nanocrystalline Ni films. The final goal is to follow and quantify the behavior of the nanograins, grain boundaries (GBs) and internal defects during in-situ tensile experiments combined with ACOM-TEM technique. As a result we will obtain stress-strain curves for various sample size and strain rate together with a complete description of the evolution of the nanostructure features (grain size, texture, GB character, twin density, dislocation density, nanostrain mapping, etc.) until fracture. These results will provide global information on the contribution of GBs processes, twinning, texture evolution due to dislocations and strain accommodation at GBs or triple junctions. The nucleation and propagation of cracks and their interaction with GBs and twin boundaries will be also investigated. This information is of interest to a broad range of scientists including physicists, engineers and materials scientists interested in the effects of the defect mechanisms at the nanoscale controlling deformation mechanisms in nanostructured systems.

Keywords:DEFECTS, TEM

Disciplines:Classical physics, Elementary particle and high energy physics, Other physical sciences