< Back to previous page

Publication

Bi-Modal Variability of nFinFET Characteristics During Hot-Carrier Stress: A Modeling Approach

Journal Contribution - Journal Article

Journal: IEEE Electron Device Letters

ISSN: 0741-3106

Issue: 10

Volume: 40

Pages: 1579 - 1582

Institutional Repository URL: https://lirias.kuleuven.be/2870704
DOI: https://doi.org/10.1109/led.2019.2933729
WoS Id: 000489740400003