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Publication

A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8fJ/bit in 40nm CMOS

Journal Contribution - Journal Article

Journal: IEEE Journal of Solid-State Circuits
ISSN: 0018-9200
Issue: 10
Volume: 54
Pages: 2765 - 2776
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:3
CSS-citation score:2
Authors from:Government, Higher Education
Accessibility:Open