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Publication

Are Extended Defects a Show Stopper for Future III-V CMOS Technologies

Journal Contribution - Journal Article Conference Contribution

Journal: Journal of Physics: Conference Series
ISSN: 1742-6588
Volume: 1190
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
Authors from:Government, Higher Education

Authors/publisher

  • C Claeys (First author)
  • Po-Chun Hsu (Author)
  • L He (Author)
  • Y Mols (Author)
  • R Langer (Author)
  • N Waldron (Author)
  • G Eneman (Author)
  • N Collaert (Author)
  • Marc Heyns (Author)
  • E Simoen (Last author)
  • P Komninou (Editor)
  • J Kioseoglou (Editor)
  • GP Dimitrakopulos (Editor)
  • V Pontikis (Editor)

Research units

Events

  • 19th International Conference on Extended Defects in Semiconductors (EDS)()

    GREECE, Thessaloniki