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Scanning Near-field Millimeter Wave Microscope Combining Dielectric Tapered Probes and Metal Tips

Journal Contribution - Journal Article Conference Contribution

In this paper, we built a free-space scattering-type scanning near-field millimeter
wave microscope using two tapered dielectric probes facing each other and a sample in between
based on MVNA. Nylon, Teflon and PVC dielectric tapered probes are compared in this system.
We adopted a PVC probe and a Teflon probe as incident and receiving probes. The resolution is
frequency dependent. In order to increase the resolution and contrast, we additionally positioned
a metal probe tip between the dielectric tapered probe and the object under test. First experiment
results on this signal improvement concept will be reported for a 2 um tungsten probe, yielding
an increased field enhancement and leading to the contrast improvement
Journal: PIERS Online
ISSN: 1931-7360
Volume: 7
Pages: 536-539
Publication year:2011
Keywords:near field, millimeter wave, scaning microscope, scattering type
  • Scopus Id: 84858134350