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Publication
Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2
Journal Contribution - Journal Article
Journal: 2D Materials
ISSN: 2053-1583
Issue: 3
Volume: 6
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:2
CSS-citation score:2
Authors from:Government, Higher Education