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Publication
Low Frequency Noise Analysis of Impact of Metal Gate Processing on the Gate Oxide Stack Quality
Journal Contribution - Journal Article
Journal: Ecs Journal Of Solid State Science And Technology
ISSN: 2162-8769
Issue: 3
Volume: 7
Pages: Q26 - Q32
Publication year:2018
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors:International
Authors from:Government, Higher Education