< Back to previous page
Publication
The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown
Journal Contribution - Journal Article
Journal: IEEE ELECTRON DEVICE LETTERS
ISSN: 1558-0563
Issue: 10
Volume: 39
Pages: 1580 - 1583
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:2
CSS-citation score:1
Authors:International
Authors from:Government
Accessibility:Closed