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Publication

Detection of IEMI Fault Injection Using Voltage Monitor Constructed with Fully Digital Circuit

Book Contribution - Book Chapter Conference Contribution

© 2018 IEEE. A threat to intentionally induce electromagnetic waves inside the cryptographic integrated circuit (IC) exists, which may cause temporary faults in processing inside the IC to acquire a secret key. We propose a method of suppressing leakage of the secret key to protect equipment from such attacks by monitoring the interfering wave inside the IC. In the proposed method, voltage variations in the amplitude and time inside the IC are measured, and an attack is detected. Further, to cheaply and easily implement the proposed method, the monitor consists of a fully digital circuit.
Book: 2018 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 2018 IEEE ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC/APEMC)
Pages: 753 - 755
Number of pages: 3
ISBN:9781509059973
Publication year:2018
BOF-keylabel:yes
IOF-keylabel:yes
Authors from:Higher Education
Accessibility:Open