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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits

Journal Contribution - Journal Article

© 2013 IEEE. This paper presents an integrated workflow for design-for-test and test signal generation of mixed-signal circuits. The DfT phase pre-partitions the core under test and allows an efficient automatic generation of test signals.-Hans-Joachim Wunderlich, Universität Stuttgart.
Journal: IEEE DESIGN & TEST
ISSN: 2168-2356
Issue: 3
Volume: 35
Pages: 24 - 30
Publication year:2018
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors from:Private, Higher Education