< Back to previous page

Publication

Influence of alloying elements on the phase formation of ultrathin Ni (<10nm) on Si(001) substrates

Book Contribution - Book Chapter Conference Contribution

© 2015 IEEE. The influence of Ni thickness on the formation of Nickel suicides was systematically investigated between 0 and 15nm. Annealing thickness gradients distinguishes Alms that agglomerate (>5nm) and films that are morphologically stable (<5nm). Alloying the initial Ni layer influences this critical thickness to higher (Al, Co) and lower (Ge, Pd, Pt) values. Pole figures and in situ XRD provides information to understand this observed shift in critical thickness.
Book: 2015 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE AND 2015 IEEE MATERIALS FOR ADVANCED METALLIZATION CONFERENCE (IITC/MAM)
Pages: 183 - 185
Number of pages: 3
ISBN:978-1-4673-7356-2
Publication year:2015
BOF-keylabel:yes
IOF-keylabel:yes
Authors from:Higher Education