< Back to previous page
Publication
A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity
Book Contribution - Book Chapter Conference Contribution
Book: 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI)
Pages: 1 - 4
ISBN:978-1-5090-5616-3
Publication year:2017
BOF-keylabel:yes
IOF-keylabel:yes
Accessibility:Open