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Researcher

Joke Hadermann

  • Research Expertise:Crystal structure characterisation of materials (with a focus on perovskite based materials and lithium battery cathode materials) using electron crystallography.
  • Keywords:TRANSMISSION ELECTRON MICROSCOPY, ELECTRON DIFFRACTION, Physics (incl. astronomy)
  • Disciplines:Crystallography
  • Research techniques:ABF-STEM (annular bright field scanning transmission electron microscopy) HAADF-STEM (high angle annular dark field scanning transmission electron electron microscopy) HR-EDX (high resolution energy dispersive X-ray analysis) SAED (selected area electron diffraction) CBED (convergent beam electron diffraction) PED (precession electron diffraction) EDT (electron diffraction tomography)
  • Users of research expertise:Researchers with questions about the structure of their materials, preferably within collaborative projects, request for collaboration can be sent by e-mail to joke.hadermann@uantwerpen.be. Industry through contacting the research group's IOF manager Alexander.Neirinckx@uantwerpen.be.