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Researcher
Zhicheng Wu
- Disciplines:Nanotechnology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 31 May 2022 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From25 Sep 2017 → 31 Jul 2020
Projects
1 - 1 of 1
- Development of Reliable Gate Stacks for Stacked MOS Devices in a 3D Sequential IntegrationFrom26 Sep 2017 → 13 Apr 2022Funding: Own budget, for example: patrimony, inscription fees, gifts
Publications
1 - 10 of 11
- LaSiOx- and Al2O3-Inserted Low-Temperature Gate-Stacks for Improved BTI Reliability in 3-D Sequential Integration(2022)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 915 - 921 - Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET(2021)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 3246 - 3253 - Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics(2021)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 4927 - 4930 - A BSIM-Based Predictive Hot-Carrier Aging Compact Model(2021)
Authors: Yang Xiang, Michiel Vandemaele, Zhicheng Wu
Pages: 1 - 9 - Effects of Back-Gate Bias on the Mobility and Reliability of Junction-Less FDSOI Transistors for 3-D Sequential Integration(2021)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 464 - 470 - Observation of Dynamic VTH of p-GaN Gate HEMTs by Fast Sweeping Characterization(2020)
Authors: Xiangdong Li, Zhicheng Wu, Guido Groeseneken
Pages: 577 - 580 - Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration(2019)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 262 - 267 - On the Impact of the Gate Work-Function Metal on the Charge Trapping Component of NBTI and PBTI(2019)
Authors: Zhicheng Wu, Guido Groeseneken
Pages: 268 - 274 - Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling(2019)
Authors: Zhicheng Wu, Guido Groeseneken
Number of pages: 7 - BTI Reliability Improvement Strategies in Low Thermal Budget Gate Stacks for 3D Sequential Integration(2018)
Authors: Zhicheng Wu, Guido Groeseneken
Number of pages: 4