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Researcher
Mireia Bargallo Gonzalez
- Disciplines:Nanotechnology, Design theories and methods
Affiliations
- Assiocated Division ESAT-INSYS (INSYS), Integrated Systems (Division)
Member
From1 Aug 2020 → 31 Mar 2011 - Associated Section of ESAT - INSYS, Integrated Systems (Division)
Member
From19 Nov 2007 → 31 Mar 2011 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 2006 → 18 Nov 2007
Publications
1 - 10 of 37
- Local compressive stress generation in electron irradiated boron-doped Si0.75Ge0.25/Si devices(2012)
Authors: Mireia Bargallo Gonzalez, Cor Claeys
Pages: 2058 - 2061 - Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations(2012)
Authors: Mireia Bargallo Gonzalez, Cor Claeys
Pages: 3337 - 3340 - Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions(2011)
Authors: Mireia Bargallo Gonzalez, Cor Claeys, Daisuke Kobayashi
Pages: 2362 - 2370 - Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy(2011)
Authors: Hidenori Ohyama, N Naka, K Takakura, I Tsunoda, Mireia Bargallo Gonzalez, Eddy Simoen, Corneel Claeys
Pages: 484 - 487 - Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy(2011)
Authors: Mireia Bargallo Gonzalez, Cor Claeys
Pages: 484 - 487 - Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions(2011)
Authors: Mireia Bargallo Gonzalez, Gang Wang, Cor Claeys
Pages: H955 - H960 - High doping density/high electric field, stress and heterojunction effects on the characteristisc of CMOS compatible p-n junctions(2011)
Authors: Mireia Bargallo Gonzalez, Daisuke Kobayashi, Cor Claeys
Pages: R27 - R36 - Growth and processing defects in CMOS homo- and hetero-epitaxy(2011)
Authors: Mireia Bargallo Gonzalez, Daisuke Kobayashi, Cor Claeys
Pages: 761 - 768 - Analysis of the temperature dependence of trap-assisted-tunneling in Ge pFETs junctions(2011)
Authors: Mireia Bargallo Gonzalez, Gang Wang, Cor Claeys
Pages: 725 - 730 - Si1-xGex-channel PFETs: scalability, layout considerations and compatibility with other stress techniques(2011)
Authors: Geert Hellings, Mireia Bargallo Gonzalez, Jacopo Franco, Cor Claeys, Kristin De Meyer
Pages: 493 - 503