< Back to previous pageResearcher Craig SchultzKeywords:Electronics and electrical engineeringDisciplines:Engineering and technologyAffiliationsElectronics and Informatics (Department)MemberFrom1 Mar 2014 → 30 Sep 2014Vrije Universiteit BrusselPublications1 - 1 of 1Comparison of spatial and aspatial logistic regression models for landmine risk mapping(2016)Authors: Craig Schultz, Aura Cecilia Alegria Caicedo, Jan Paul Herman Cornelis, Hichem SahliPages: 52-63