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Publication
Defect distributions in thin film solar cells deduced from admittance measurements under different bias voltages
Journal Contribution - Journal Article
Journal: JOURNAL OF APPLIED PHYSICS
ISSN: 0021-8979
Issue: 6
Volume: 110
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:0.1
CSS-citation score:2
Authors:International
Authors from:Higher Education
Accessibility:Closed