< Back to previous page

Researcher

Stijn Van Malderen

  • Keywords:Elemental imaging, ICP-mass spectrometry, Advanced analysis methods of X-ray based techniques, XRF
  • Disciplines:Analytical chemistry not elsewhere classified, Spectroscopic methods, Instrumental methods, Chemical aspects of sensor technology, Analytical spectrometry, Data visualisation and imaging, Modelling and simulation, Numerical computation, Signal processing not elsewhere classified, High performance computing, Chemometrics